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Poster
How Faithful is your Synthetic Data? Sample-level Metrics for Evaluating and Auditing Generative Models
Ahmed Alaa · Boris van Breugel · Evgeny S. Saveliev · Mihaela van der Schaar

Tue Jul 19 03:30 PM -- 05:30 PM (PDT) @ Hall E #218
in Poster Session 1 »

Devising domain- and model-agnostic evaluation metrics for generative models is an important and as yet unresolved problem. Most existing metrics, which were tailored solely to the image synthesis setup, exhibit a limited capacity for diagnosing the different modes of failure of generative models across broader application domains. In this paper, we introduce a 3-dimensional evaluation metric, (α-Precision, β-Recall, Authenticity), that characterizes the fidelity, diversity and generalization performance of any generative model in a domain-agnostic fashion. Our metric unifies statistical divergence measures with precision-recall analysis, enabling sample- and distribution-level diagnoses of model fidelity and diversity. We introduce generalization as an additional, independent dimension (to the fidelity-diversity trade-off) that quantifies the extent to which a model copies training data—a crucial performance indicator when modeling sensitive data with requirements on privacy. The three metric components correspond to (interpretable) probabilistic quantities, and are estimated via sample-level binary classification. The sample-level nature of our metric inspires a novel use case which we call model auditing, wherein we judge the quality of individual samples generated by a (black-box) model, discarding low-quality samples and hence improving the overall model performance in a post-hoc manner.

Keywords: APP: Everything Else

Author Information

Ahmed Alaa (UCLA)
Boris van Breugel (University of Cambridge)
Evgeny S. Saveliev (University of Cambridge)
Mihaela van der Schaar (University of Cambridge and UCLA)

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